{"id":13963,"date":"2025-11-18T09:58:44","date_gmt":"2025-11-18T07:58:44","guid":{"rendered":"https:\/\/schaefer-scientific.com\/?p=13963"},"modified":"2025-11-18T10:04:50","modified_gmt":"2025-11-18T08:04:50","slug":"xiii-workshop-uber-anwendungen-der-rastersondenmikroskopie-stm-afm-2025","status":"publish","type":"post","link":"https:\/\/schaefer-scientific.com\/de\/event\/xiii-workshop-on-applications-of-scanning-probe-microscopy-stm-afm-2025","title":{"rendered":"XIII Workshop \u00fcber Anwendungen der Rastersondenmikroskopie - STM\/AFM 2025"},"content":{"rendered":"

Zakopane, 26 - 30 November 2025<\/strong><\/p>\n\n\n\n

Das Hauptziel der Workshop-Reihe ist es, Wissenschaftler zu versammeln, die sich mit der Oberfl\u00e4chenforschung mittels Rastersondenmikroskopie (SPM) besch\u00e4ftigen oder besch\u00e4ftigen m\u00f6chten. Zu diesen SPM-Methoden geh\u00f6ren die Rastertunnelmikroskopie (STM), die Rasterkraftmikroskopie (AFM) und andere verwandte Techniken, die im Ultrahochvakuum und unter Fl\u00fcssigkeits-\/Gasatmosph\u00e4re arbeiten. Wir w\u00fcnschen uns, dass der Workshop ein interdisziplin\u00e4res Treffen f\u00fcr Teilnehmer ist, die verschiedene theoretische und experimentelle Disziplinen der wissenschaftlichen Forschung vertreten.<\/p>\n\n\n\n

Die offizielle Sprache der Konferenz ist Englisch<\/strong><\/p>\n\n\n\n

Mehr Infos<\/strong><\/a><\/p>","protected":false},"excerpt":{"rendered":"

Zakopane, 26 – 30 November 2025 The main goal of the Workshop series is to gather scientists who are or who would like to be involved in surface science research using Scanning Probe Microscopy (SPM). These SPM methods include Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and other related techniques operating in ultra-high vacuum […]<\/p>\n","protected":false},"author":1,"featured_media":13964,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[66],"tags":[],"class_list":["post-13963","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-event"],"acf":[],"yoast_head":"\nXIII Workshop on Applications of Scanning Probe Microscopy - STM\/AFM 2025 - Schaefer Scientific<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/schaefer-scientific.com\/de\/veranstaltung\/xiii-workshop-uber-anwendungen-der-rastersondenmikroskopie-stm-afm-2025\/\" \/>\n<meta property=\"og:locale\" content=\"de_DE\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"XIII Workshop on Applications of Scanning Probe Microscopy - STM\/AFM 2025 - Schaefer Scientific\" \/>\n<meta property=\"og:description\" content=\"Zakopane, 26 – 30 November 2025 The main goal of the Workshop series is to gather scientists who are or who would like to be involved in surface science research using Scanning Probe Microscopy (SPM). 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