{"id":14120,"date":"2026-03-09T11:14:53","date_gmt":"2026-03-09T09:14:53","guid":{"rendered":"https:\/\/schaefer-scientific.com\/?p=14120"},"modified":"2026-03-09T11:14:54","modified_gmt":"2026-03-09T09:14:54","slug":"praxis-der-rasterelektronenmikroskopie-und-mikrobereichsanalyse","status":"publish","type":"post","link":"https:\/\/schaefer-scientific.com\/de\/event\/practice-of-scanning-electron-microscopy-and-microarea-analysis","title":{"rendered":"Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse"},"content":{"rendered":"

Datum<\/strong>: Februar 25 - M\u00e4rz 20, 2026<\/p>\n\n\n\n

Standort<\/strong>: M\u00fcnster, Deutschland<\/p>\n\n\n\n

Dieser Kurs bef\u00e4higt technisches und wissenschaftliches Personal aus Industrie, Forschungseinrichtungen, Pr\u00fcflabors, Universit\u00e4ten oder Beh\u00f6rden, ein Rasterelektronenmikroskop (REM) und ein Mikroanalysesystem (EDX\/WDX) in Theorie und Praxis selbst\u00e4ndig zu bedienen. Die Teilnehmer lernen, die Rasterelektronenmikroskopie und Mikroanalyse optimal auf ihre eigenen Forschungsfragen anzuwenden, Proben mit den verschiedenen Signalen (z.B. SE, RE) eines Rasterelektronenmikroskops abzubilden, qualitative und quantitative Elementanalysen durchzuf\u00fchren und ihre eigenen Ergebnisse zu interpretieren und kritisch zu bewerten. Verschiedene Pr\u00e4parationsmethoden und Beschichtungsm\u00f6glichkeiten werden ebenfalls vorgestellt und ge\u00fcbt.<\/p>\n\n\n\n

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Mehr Infos<\/a><\/div>\n<\/div>\n\n\n\n

<\/p>","protected":false},"excerpt":{"rendered":"

Date: February 25 – March 20, 2026 Location: M\u00fcnster, Germany This course enables technical and scientific staff from industry, research institutions, testing laboratories, universities, or government agencies to independently operate a scanning electron microscope (SEM) and a micro-analysis system (EDX\/WDX) in theory and practice. Participants will learn to optimally apply scanning electron microscopy and micro-analysis […]<\/p>\n","protected":false},"author":1,"featured_media":43,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[66],"tags":[62],"class_list":["post-14120","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-event","tag-phenom"],"acf":[],"yoast_head":"\nPractice of scanning electron microscopy and microarea analysis - Schaefer Scientific<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/schaefer-scientific.com\/de\/veranstaltung\/praxis-der-rasterelektronenmikroskopie-und-mikrobereichsanalyse\/\" \/>\n<meta property=\"og:locale\" content=\"de_DE\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Practice of scanning electron microscopy and microarea analysis - Schaefer Scientific\" \/>\n<meta property=\"og:description\" content=\"Date: February 25 – March 20, 2026 Location: M\u00fcnster, Germany This course enables technical and scientific staff from industry, research institutions, testing laboratories, universities, or government agencies to independently operate a scanning electron microscope (SEM) and a micro-analysis system (EDX\/WDX) in theory and practice. 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