{"id":1090,"date":"2025-07-17T15:37:23","date_gmt":"2025-07-17T13:37:23","guid":{"rendered":"https:\/\/schaefer-scientific.com\/?post_type=product&p=1090"},"modified":"2025-07-17T15:48:11","modified_gmt":"2025-07-17T13:48:11","slug":"ionenfrasgerate","status":"publish","type":"product","link":"https:\/\/schaefer-scientific.com\/de\/product\/ion-milling-equipment","title":{"rendered":"Ionenfr\u00e4sger\u00e4te"},"content":{"rendered":"
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F\u00fcr REM-Benutzer:<\/h2>\n\n\n\n

SEMPrep Smart<\/h3>\n\n\n\n

Ionen\u00e4tzsystem der neuen Generation f\u00fcr Querschnittsschnitte und besch\u00e4digungsfreies Polieren der Probenoberfl\u00e4che f\u00fcr SEM- und EBSD-Anwender<\/p>\n\n\n\n

    \n
  • Einfacher und automatisierter Betrieb<\/li>\n\n\n\n
  • Gr\u00f6\u00dfter Energiebereich auf dem Markt (<100 eV-16 keV)<\/li>\n\n\n\n
  • Einzigartige vorgekippte Probenhalter f\u00fcr Schr\u00e4gschnitte (30\u00b0, 90\u00b0)<\/li>\n\n\n\n
  • +\/- 1 \u00b5m Positioniergenauigkeit f\u00fcr den Querschnitt<\/li>\n\n\n\n
  • Probengr\u00f6\u00dfe bis zu 50 mm Durchmesser<\/li>\n\n\n\n
  • Ladungssicherungssystem f\u00fcr schnellen Probenaustausch<\/li>\n\n\n\n
  • Optionale Vakuumtransfereinheit<\/li>\n\n\n\n
  • Fl\u00fcssigstickstoff oder Peltier-K\u00fchlung als Option<\/li>\n\n\n\n
  • \u00d6lfreies Vakuumsystem<\/li>\n<\/ul>\n<\/div>\n\n\n\n
    \n
    \"\"<\/figure>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
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    F\u00fcr TEM-Benutzer:<\/h2>\n\n\n\n

    UniMill<\/h3>\n\n\n\n

    Vollautomatisches Ionenstrahl-D\u00fcnnungssystem f\u00fcr die TEM\/XTEM-Probenvorbereitung<\/p>\n\n\n\n

      \n
    • Einfacher und automatisierter Betrieb<\/li>\n\n\n\n
    • Gr\u00f6\u00dfter Energiebereich auf dem Markt (100 eV - 16 keV)<\/li>\n\n\n\n
    • Automatischer Perforationsdetektor<\/li>\n\n\n\n
    • Load-Lock-System f\u00fcr schnellen Probenaustausch<\/li>\n\n\n\n
    • Option Fl\u00fcssigstickstoffk\u00fchlung<\/li>\n\n\n\n
    • Online-\u00dcberwachung und -Support<\/li>\n<\/ul>\n<\/div>\n\n\n\n
      \n
      \"\"<\/figure>\n<\/div>\n<\/div>\n\n\n\n
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      Sanfte M\u00fchle<\/h3>\n\n\n\n

      Ionenstrahl-Workstation f\u00fcr die Endreinigung und Endpolitur von TEM\/FIB-Proben h\u00f6chster Qualit\u00e4t<\/p>\n\n\n\n

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      • Automatisierter Betrieb<\/li>\n\n\n\n
      • Der letzte Schritt f\u00fcr ein perfektes Ergebnis<\/li>\n\n\n\n
      • Vakuum-Transfer-Shuttle<\/li>\n\n\n\n
      • Spezialadapter f\u00fcr Hitachi-Mikroskope<\/li>\n\n\n\n
      • Online-\u00dcberwachung und -Support<\/li>\n<\/ul>\n\n\n\n

        MAG*I*CAL
        R\u00fcckf\u00fchrbare Transmissions-Elektronenmikroskopie-Kalibrierungsprobe<\/p>\n\n\n\n

        TiDisc
        Spezielles Einbettungsgitter f\u00fcr TEM\/XTEM-Proben<\/p>\n<\/div>\n\n\n\n

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        \"\"<\/figure>\n<\/div>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n<\/div>\n\n\n\n
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        \"\"<\/figure>\n<\/div>\n\n\n\n
        <\/div>\n\n\n\n
        <\/div>\n<\/div>\n<\/div>\n<\/div>","protected":false},"featured_media":1091,"template":"","meta":{"_acf_changed":false},"application":[36],"manufacturer":[37],"product-category":[27],"class_list":["post-1090","product","type-product","status-publish","has-post-thumbnail","hentry","application-polishing-or-cross-sectioning-for-sem-tem","manufacturer-technoorg-linda","product-category-sample-preparation-for-sem-tem"],"acf":[],"yoast_head":"\nIon Milling Equipment - Schaefer Scientific<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/schaefer-scientific.com\/de\/produkt\/ionenfrasgerate\/\" \/>\n<meta property=\"og:locale\" content=\"de_DE\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Ion Milling Equipment - Schaefer Scientific\" \/>\n<meta property=\"og:description\" content=\"For SEM users: SEMPrep Smart New generation ion etching system for cross-sectional cuts and damage-free polishing of the sample surface for SEM and EBSD users For TEM users: UniMill Fully automated ion beam thinning system for TEM\/XTEM sample preparation Gentle Mill Ion beam workstation for final cleaning and end-polishing of highest quality TEM\/FIB samples MAG*I*CALTraceable […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/schaefer-scientific.com\/de\/produkt\/ionenfrasgerate\/\" \/>\n<meta property=\"og:site_name\" content=\"Schaefer Scientific\" \/>\n<meta property=\"article:modified_time\" content=\"2025-07-17T13:48:11+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/schaefer-scientific.com\/wp-content\/uploads\/2025\/07\/SEMPREP-smart_EBSD.webp\" \/>\n\t<meta property=\"og:image:width\" content=\"2000\" \/>\n\t<meta property=\"og:image:height\" content=\"1076\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/webp\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Gesch\u00e4tzte Lesezeit\" \/>\n\t<meta name=\"twitter:data1\" content=\"4\u00a0Minuten\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/product\\\/ion-milling-equipment\",\"url\":\"https:\\\/\\\/schaefer-scientific.com\\\/product\\\/ion-milling-equipment\",\"name\":\"Ion Milling Equipment - 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