NC-AFM 2026 is the 27th of a series of conferences devoted to non-contact atomic force microscopy.
The conference covers experimental, theoretical, and instrumental developments in frequency modulation and other dynamic modes of scanning force microscopy with particular emphasis on high-resolution imaging and force mapping.
Scopes
The conference welcomes the contribution for oral and poster presentations on the following topics (but not limited to):
- Novel instrumentation and techniques
- Atomic resolution imaging on insulating substrates, semiconductors, and metals
- High-resolution imaging of molecules, clusters and biological systems
- Atomic-scale imaging and spectroscopic measurements of 2D materials & quantum materials
- Simultaneous force and tunneling spectroscopy
- Theoretical analysis of contrast mechanisms; forces & tunneling phenomena
- Nanoscale measurements of charges, work function, and magnetic properties
- Imaging and spectroscopy in liquid and ambient environments
- Lateral force and friction, damping and energy dissipation
- Machine learning and big data
- Theory and simulations
- Any related science
