{"id":14347,"date":"2026-07-24T15:52:10","date_gmt":"2026-07-24T13:52:10","guid":{"rendered":"https:\/\/schaefer-scientific.com\/?p=14347"},"modified":"2026-07-31T14:43:54","modified_gmt":"2026-07-31T12:43:54","slug":"schaefer-scientific-et-rhk-technology-a-la-conference-nc-afm-2026","status":"publish","type":"post","link":"https:\/\/schaefer-scientific.com\/fr\/event\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference","title":{"rendered":"Schaefer Scientific et RHK Technology \u00e0 la conf\u00e9rence NC-AFM 2026\u00a0"},"content":{"rendered":"<p class=\"wp-block-paragraph\">NC-AFM 2026 est la 27\u00e8me conf\u00e9rence d'une s\u00e9rie d\u00e9di\u00e9e \u00e0 la microscopie \u00e0 force atomique sans contact. L'\u00e9v\u00e9nement se tiendra du 3 au 7 ao\u00fbt 2026, \u00e0 Innsbruck, en Autriche.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">La conf\u00e9rence couvre les d\u00e9veloppements exp\u00e9rimentaux, th\u00e9oriques et instrumentaux en modulation de fr\u00e9quence et autres modes dynamiques de microscopie \u00e0 force de balayage, avec un accent particulier sur l'imagerie \u00e0 haute r\u00e9solution et la cartographie des forces.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Si vous assistez \u00e0 la NC-AFM 2026, nous vous invitons \u00e0 rencontrer nos coll\u00e8gues :<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Dr. Rajan Adhikari \u2013 Scientifique r\u00e9sident, Schaefer Scientific<\/strong><\/li>\n<\/ul>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Dr Steffen Porthun \u2013 Chercheur principal, RHK Technology<\/strong><\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\" id=\"form\">Ils seront disponibles tout au long de la conf\u00e9rence pour discuter des d\u00e9veloppements r\u00e9cents en microscopie \u00e0 sonde \u00e0 balayage ultra-haute vide (UHV SPM), notamment :<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Avanc\u00e9es r\u00e9centes dans l'architecture mat\u00e9rielle et logicielle du contr\u00f4leur SPM RHK R10<\/li>\n\n\n\n<li>Une affiche de conf\u00e9rence (cliquez ici pour t\u00e9l\u00e9charger l'affiche) pr\u00e9sentant les capacit\u00e9s avanc\u00e9es du contr\u00f4leur R10<\/li>\n\n\n\n<li>Mises \u00e0 jour sur les syst\u00e8mes PanScan freedom II (5K, 7T) et Beetle AFM\/STM<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Nos coll\u00e8gues se r\u00e9jouissent de rencontrer les investigateurs principaux (IP), les scientifiques et les chercheurs \u00e0 Innsbruck pour \u00e9changer des id\u00e9es et discuter de futures collaborations.<\/p>\n\n\n\n<div class=\"wp-block-columns are-vertically-aligned-center has-border-color has-background is-layout-flex wp-container-core-columns-is-layout-75a0c53c wp-block-columns-is-layout-flex\" style=\"border-color:#e4e4e4;border-width:1px;background-color:#f5f5f5;padding-top:0px;padding-right:0px;padding-bottom:0px;padding-left:0px\">\n<div class=\"wp-block-column is-vertically-aligned-center is-layout-flow wp-block-column-is-layout-flow\">\n<figure class=\"wp-block-image size-full\"><img fetchpriority=\"high\" decoding=\"async\" width=\"805\" height=\"805\" src=\"https:\/\/schaefer-scientific.com\/wp-content\/uploads\/2026\/07\/Poster-promo.webp\" alt=\"Affiche Scientifique Schaefer - R10 Des bits aux liaisons \u2013 Une plateforme SPM avanc\u00e9e\" class=\"wp-image-14370\" style=\"aspect-ratio:1;object-fit:contain\"\/><\/figure>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-vertically-aligned-center is-layout-flow wp-block-column-is-layout-flow\" style=\"padding-top:32px;padding-right:32px;padding-bottom:32px;padding-left:32px\">\n<p class=\"has-text-color has-link-color wp-elements-1 wp-block-paragraph\" style=\"color:#0038a8\"><strong>T\u00e9l\u00e9chargement gratuit<\/strong><\/p>\n\n\n\n<h3 class=\"wp-block-heading has-black-color has-text-color has-link-color wp-elements-2\">Demandez votre copie de l'affiche scientifique Schaefer : R10 From Bits to Bonds \u2013 Une plateforme SPM avanc\u00e9e<\/h3>\n\n\n\n<div class=\"wp-block-buttons is-layout-flex wp-block-buttons-is-layout-flex\">\n<div class=\"wp-block-button is-style-fill\"><a class=\"wp-block-button__link has-white-color has-text-color has-background has-link-color wp-element-button\" href=\"https:\/\/schaefer-scientific.com\/fr\/produit\/electronique-et-logiciel-modulaires-spm\/#poster\" style=\"border-top-left-radius:0px;border-top-right-radius:0px;border-bottom-left-radius:0px;border-bottom-right-radius:0px;background-color:#0038a8\">Requ\u00eate ici<\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Port\u00e9es<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">La conf\u00e9rence accueille les contributions pour des pr\u00e9sentations orales et par affiche sur les sujets suivants (sans s'y limiter) :<\/p>\n\n\n\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-7387b849 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<ul class=\"wp-block-list\">\n<li>Nouvelles instrumentations et techniques<\/li>\n\n\n\n<li>Imagerie \u00e0 r\u00e9solution atomique sur substrats isolants, semi-conducteurs et m\u00e9taux<\/li>\n\n\n\n<li>Imagerie \u00e0 haute r\u00e9solution de mol\u00e9cules, d'amas et de syst\u00e8mes biologiques<\/li>\n\n\n\n<li>Imagerie et mesures spectroscopiques \u00e0 l'\u00e9chelle atomique des mat\u00e9riaux 2D et des mat\u00e9riaux quantiques<\/li>\n\n\n\n<li>Spectroscopie simultan\u00e9e de force et de tunnel<\/li>\n\n\n\n<li>Analyse th\u00e9orique des m\u00e9canismes de contraste ; forces et ph\u00e9nom\u00e8nes de tunnel<\/li>\n<\/ul>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\">\n<ul class=\"wp-block-list\">\n<li>Mesures \u00e0 l'\u00e9chelle nanom\u00e9trique des charges, de la fonction de travail et des propri\u00e9t\u00e9s magn\u00e9tiques<\/li>\n\n\n\n<li>Imagerie et spectroscopie en environnements liquides et ambiants<\/li>\n\n\n\n<li>Force lat\u00e9rale et frottement, amortissement et dissipation d'\u00e9nergie<\/li>\n\n\n\n<li>Apprentissage automatique et m\u00e9gadonn\u00e9es<\/li>\n\n\n\n<li>Th\u00e9orie et simulations<\/li>\n\n\n\n<li>Toute science connexe<\/li>\n<\/ul>\n<\/div>\n<\/div>\n\n\n\n<p class=\"wp-block-paragraph\"><strong><a href=\"https:\/\/www.uibk.ac.at\/en\/congress\/nc-afm-2026\/\" target=\"_blank\" rel=\"noreferrer noopener\">Plus d'informations<\/a><\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>","protected":false},"excerpt":{"rendered":"<p>NC-AFM 2026 is the 27th of a series of conferences devoted to non-contact atomic force microscopy. The event will take place from August 3 to 7, 2026, in Innsbruck, Austria. The conference covers experimental, theoretical, and instrumental developments in frequency modulation and other dynamic modes of scanning force microscopy with particular emphasis on high-resolution imaging [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":14350,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[66],"tags":[],"class_list":["post-14347","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-event"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.6 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Schaefer Scientific and RHK Technology at the NC-AFM 2026 Conference\u00a0 - Schaefer Scientific<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/schaefer-scientific.com\/fr\/evenement\/schaefer-scientific-et-rhk-technology-a-la-conference-nc-afm-2026\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Schaefer Scientific and RHK Technology at the NC-AFM 2026 Conference\u00a0 - Schaefer Scientific\" \/>\n<meta property=\"og:description\" content=\"NC-AFM 2026 is the 27th of a series of conferences devoted to non-contact atomic force microscopy. 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The conference covers experimental, theoretical, and instrumental developments in frequency modulation and other dynamic modes of scanning force microscopy with particular emphasis on high-resolution imaging [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/schaefer-scientific.com\/fr\/evenement\/schaefer-scientific-et-rhk-technology-a-la-conference-nc-afm-2026\/\" \/>\n<meta property=\"og:site_name\" content=\"Schaefer Scientific\" \/>\n<meta property=\"article:published_time\" content=\"2026-07-24T13:52:10+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2026-07-31T12:43:54+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/schaefer-scientific.com\/wp-content\/uploads\/2026\/07\/Schaefer-Scientific-RHK-event.webp\" \/>\n\t<meta property=\"og:image:width\" content=\"1807\" \/>\n\t<meta property=\"og:image:height\" content=\"1080\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/webp\" \/>\n<meta name=\"author\" content=\"jensbonnier\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"\u00c9crit par\" \/>\n\t<meta name=\"twitter:data1\" content=\"jensbonnier\" \/>\n\t<meta name=\"twitter:label2\" content=\"Dur\u00e9e de lecture estim\u00e9e\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/event\\\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/event\\\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference\"},\"author\":{\"name\":\"jensbonnier\",\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/#\\\/schema\\\/person\\\/7c7118f14af6debc704d829b25555bf0\"},\"headline\":\"Schaefer Scientific and RHK Technology at the NC-AFM 2026 Conference\u00a0\",\"datePublished\":\"2026-07-24T13:52:10+00:00\",\"dateModified\":\"2026-07-31T12:43:54+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/event\\\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference\"},\"wordCount\":299,\"publisher\":{\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/event\\\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/schaefer-scientific.com\\\/wp-content\\\/uploads\\\/2026\\\/07\\\/Schaefer-Scientific-RHK-event.webp\",\"articleSection\":[\"Event\"],\"inLanguage\":\"fr-FR\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/schaefer-scientific.com\\\/event\\\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference\",\"url\":\"https:\\\/\\\/schaefer-scientific.com\\\/event\\\/schaefer-scientific-and-rhk-technology-at-the-nc-afm-2026-conference\",\"name\":\"Schaefer Scientific and RHK Technology at the NC-AFM 2026 Conference\u00a0 - 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