Park Systems delivers advanced nanoscale metrology solutions across both research and industrial applications.
Explore Park Systems’ full range of atomic force microscopes designed for scientific and engineering research.
Integration of Smart Scan software, an AI-powered operating system, simplifies the AFM operation, making it effortlessly navigable for novices and experts alike. This amalgamation of advanced features defines reliability, precision, and ease of use inherent to all Park AFMs.
Small sample AFMs
Park NX10 – premiere choice for nanotechnology research
The Park NX10’s easy tip exchange combined with SmartScan software’s one-click imaging and pre-programmed advanced modes make Park AFMs stand out.
- Unparalleled accuracy and high-resolution imaging with industry-leading low-noise
- Motorized configuration, with easy tip and sample exchange mechanism and a fast automatic tip approach that requires no user intervention
- Topographical imaging and the characterization of electrical, magnetic, thermal, and mechanical properties at the nanoscale, make the Park NX10 model the premier choice for cutting-edge materials science research
- Built for electrochemical analysis
Park FX40 – The Automatic AFM
Integrated intelligence and robotics automate set up and scanning tasks, allowing users to focus on their specialized work
- Automatic sample positioning, automatic probe reading, automatic probe exchange, automatic beam alignment
- Safety features: Safety Probe Landing, Real-Time Environmental Monitoring, Automatic Warning Detection
- Comprehensive range of AFM modes for diverse applications
- Best AFM to work with in a glove box
Park NX7 A- the affordable choice
Designed with the same attention to detail, NX7 allows you to do your research on time and within budget.
- Unparalleled accuracy and high-resolution imaging with industry-leading low-noise
- Comprehensive range of AFM modes for diverse applications
- Flexible Open-Access, customizable for cooperating with various research environments
- Nanomechanical, electrical, magnetic, chemical, thermal, in liquid analysis are available
Large sample AFMs
Park Systems AFM versatile models support design, defect detection, and quality control across various semiconductor applications and budgets—enabling faster, more accurate characterization and process optimization.
Park NX20
Is the go-to solution for failure analysis and semiconductor metrology. Park NX20 has one of the most user-friendly designs and automated interfaces in the industry
- Sidewall measurements for 3D structure study
- High resolution electrical scan mode
- Step scan automation, a user-programmable multiple region imaging
- Comprehensive range of AFM modes for diverse applications
Park NX20 300mm
Is the premier choice for large-sample AFM inspection, specifically tailored for failure analysis, quality assurance, and quality control of semiconductor applications, allowing efficient inspection of entire 300mm wafers
- Unparalleled accuracy and high-resolution imaging with industry-leading low-noise
- 300mm motorized XY stage
- Smart Scan operating software-automation software
- Step scan automation, a user-programmable multiple region imaging
Comprehensive range of AFM modes for diverse applications
Park FX200
Ideal choice for both research and industrial applications, the FX200 sets a new standard in precision and reliability. Its faster Z servo performance and improved high-power sample view enhance operational efficiency and imaging capabilities.
- Intelligent automation: automatic probe recognition and probe exchange, laser beam alignment, and macro-optics for full sample view, optical autofocus, navigation, and sequential measurements at multiple coordinates
- Next generation AFM controller
- Accommodates wafers up to a variety of sample sizes, including up to 200 mm wafers
- Holds up to 16 coupon-sized samples simultaneously
- Comprehensive range of AFM modes for diverse applications
Park FX300
Designed to break the boundaries between research and industrial applications with advanced capabilities for industrial & research AFM applications
- Fully capable of measuring up to 300 mm wafers, it supports a wide range of advanced AFM applications, including the optionally available nano-IR technology
- Next generation AFM controller
- Allows predefined coordinate settings on large samples, such as 300 mm wafers or samples on multi-sample chuck, for automated execution
- Holds up to 16 coupon-sized samples simultaneously
- Supports sequential measurements including topography and advanced modes and streamlining workflows in research and industrial environments.
Park nano IR AFM
Integrated nanoscale IR spectroscopy for precise chemical analysis, by incorporating the latest infrared spectroscopy—photo-induced force microscopy (PiFM)—into the industry-leading Park AFM platform. Versatile sample measurements sized from small to 300 mm wafers
- Delivers spatial resolution beyond that of conventional IR spectroscopy and other nanoscale techniques while ensuring consistently high resolution and measurement accuracy throughout the analysis.
- Next generation AFM controller
- Integration of sideband techniques enables the detection of subtle molecular bonding information, with depth-sensitive insights via direct drive and sideband bimodal detection methods.
- Cutting-Edge PiFM Technology, a non-contact detection technique which ensures more precise and consistent results while protecting delicate samples
- High-resolution IR spectra and IR absorption images at the nanoscale with excellent correlation with conventional FTIR (Fourier Transform Infrared) spectroscopy.
Specialized AFMs
Park NX12
Ideal for multi-user facilities serving a wide range of research disciplines. Adaptable platform covers a range of applications, from nanomechanical mapping, scanning ion conductance microscopy to inverted optical microscopy and electrochemistry research.
- It includes a pipette-based scanning system for high-resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
- Accommodate standard ambient AFM, in-liquid SPM, optical, and nano-optical imaging.
- Perfect for live cell investigations with AFM and SICM
- Enables study of the electrochemical properties
Park NX Hivac
a high vacuum AFM ideal for precise semiconductor failure analysis and sensitive materials research. Operating in a high vacuum environment, NX Hivac is the key to a range of applications, including dopant concentration assessment using Scanning Spreading Resistance Microscopy (SSRM)
- With intuitive its own Hivac Manager and automatic vacuum control
- Enables materials scientific research that requires high accuracy and high resolution measurements in a vacuum environment free from oxygen and other agents.
- Step Scan automation with motorized stage
- Low noise XYZ position sensors
Schaefer SouthEast Europe srl – the exclusive regional distributor since 2008 for Park Systems AFMs (Greece, Romania, Slovenia, Croatia, South of Cyprus, Bulgaria, Hungary, Moldova, Serbia).
Provides advanced application support, installation, training and post training support, though experienced AFM specialists.
Get in touch with our Product Specialist Claudia at the Romanian office: claudia.moldovan@schaefer-scientific.com
