CSI Nano-Observer

Easy to use and intuitive operation

Pre-aligning tip holders avoid time consuming laser alignment

A top and side view video microscope with lateral illumination ensures a perfect optical control for tip approach and sample navigation

8 electrical contacts to the tip allow the operation in different modes with one and the same tip

The intuitive Nanosolution software allows the simple switching between pre-configured measurement-modes without adding modules or connections

Multiple Modes

The Nano-Observer platform is based on a modular design. In addition to the standard configuration that allows the operation of all topography modes, the AFM can be upgrade with advanced electrical modes for measuring electrical fields, sample resistivity, doping concentration, piezoelectric properties but also for magnetic properties in magnetic field generators, measurements in special gas atmospheres, liquid or variable temperatures.

ResiScope^TM and Soft ResiScope

Advanced Conductive Nano-Characterization

The ResiScope is the most advanced module for conductive measurements that enables conductivity measurements over 10 decades (from 100 fA to 1 mA) within one image.

Surfaces with both, highly conductive and insulating domains can be mapped overcoming undesired side-effects like probe-induced local oxidation, bimetallic effects or melting of the conductive coating.

It can be combined with several dynamic modes as MFM/EFM or KFM providing several signal channels with the same tip on the same sample area.

The Soft ResiScope enables the conductivity measurement also for the Intermittent Contact Mode.

So even for fragile and soft surfaces, conductivity maps can be acquired that would never be measurable with Contact Conductive AFM techniques

Scanning Microwave Impedance Microscopy

Scanning Microwave Impedance Microscopy (sMIM) is a new AFM imaging mode providing the carrier concentration and carrier type (n or p) in high quality images with a resolution of better than 50 nm.

The core of sMIM technology is utilizing 3GHz microwave reflections from a nm-scale sample region directly under the very small spatial region of a sMIM probe tip.

By analyzing the sample response, the local sample properties: ε,σ,& μ can be determined.

This method is compatible with a wide range of materials: dielectrics, insulators, semiconductors, and metals.

Unlike other conventional electrical AFM modes, sMIM can simultaneously image these different materials classes without multiple settings or measurements.

Magnetic Lateral Field Module

Magnetic Lateral Field Module (MLFM) allows Magnetic Force Microscopy (MFM) measurements in a controllable external magnetic field. A possible application is for example the mapping of magnetic domain behavior in dependence of the external field strength.

Environmental control and optical access

The Nano-Observer is designed to offer environmental control (gas, humidity…). It is compatible to all electrical modes that often require dry and oxygen-free conditions.

In addition the sample temperature can be controlled from ambient to 200°C to investigate temperature-dependent surface property changes.

Also a plug and play Liquid Cell is available. It enables liquid scanning without any additional adjustments or laser prealignment.

The compact design of the Nano-Observer further easily enables the integration into an optical analysis setup like Raman for example.