Our Application Days offer a unique opportunity to explore modern analytical technologies through live demonstrations, expert presentations, and interactive workshops.

Learn more about practical applications, workflows, and innovations in scanning electron microscopy, materials analysis, and other advanced analytical techniques from leading instrument manufacturers.

Who Is This Event For?

For beginners through to experienced experts from industry, research, and academia. Focus on modern analytical technologies, materials analysis, quality control, and laboratory solutions. Live demonstrations, expert presentations, and hands-on workshops provide direct insights. Direct exchange with application specialists and industry experts.

When is the event?

September 23, from 10:00 to 16:30.

Agenda

Attendees can look forward to a comprehensive program on the latest developments in analytical technology and their practical applications.

ARRIVAL
10:00 – 10:15
Walk-in
Arrival and registration
10:15 – 10:20
Welcome
Block 1
10:20 – 10:45
Material identification in the field and in the lab
XRF and OES compared, Sascha Reh
10:45 – 11:10
Scanning electron microscopy
Fundamentals, applications and sample preparation, Dr. Lars Jansen
11:10 – 12:10: Workshop Session 1
The workshops run in parallel. Attendance is by free choice
APhenom SEM: From sample to SEM image: optimal preparation for meaningful analyses
BBruker XRF and OES: Material identification and materials analysis
CBosch BOGS: Gas analysis in research and industry
BREAK
12:20 – 13:20
Lunch break
Lunch, with time for discussion and networking
Block 2
13:20 – 13:50
SEM sample preparation with Ar⁺ ions: fundamentals and application examples
Dr.-Ing. Enrico Bruder, Technical University of Darmstadt, Physical Metallurgy Group
13:50 – 14:00
TechnoOrg Linda Ion Mills
Overview of models and configurations, Dipl.-Phys. Martin Schaefer
14:00 – 14:30
Modern gas analysis
Process monitoring and quality control with Bosch BOGS, Frank Stieler
14:30 – 15:30: Workshop Session 2
The workshops run in parallel. Attendance is by free choice
APhenom SEM: From sample to SEM image: optimal preparation for meaningful analyses
BBruker XRF and OES: Material identification and materials analysis
CBosch BOGS: Gas analysis in research and industry
15:30
Excursion to TU Darmstadt
Departure for a tour of the SEMProp Smart ion mill (approx. 30 minutes travel time)
15:30 – 16:30
Open Lab & Expert Sessions
One-on-one technical talks and application discussions
Programme subject to change

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