Phenom Desktop SEM

PHENOM PRO, ProX (350,000x, <8nm Resolution, EDX Elemental Analysis)

• Excellent image quality thanks to the CeB₆ source  with high brilliance at low acceleration voltages
• Ca. 1500 working hours of the source (4-6 years of typical use)
• Magnification up to 350,000x (plus 12x digital zoom)
• Variable acceleration voltage (for ProX and XL)
• EDX elemental analysis (optional for Phenom Pro and Pure)
• Optional SED Detector
• Fast sample preparation
• Easy and fast sample transfer (10-15 seconds)
• Intuitive navigation
• Motorized precision-XY stage
• Color CCD camera incl. zoom 20x up to 120x (Pro and ProX)
• Robust, space-saving construction; straightforward operation
• As options: 3D reconstruction, surface roughness measurement, stitching and automatic measurement of fiber cross-sections.

ParticleMetric Software (Particle Measurement)

Phenom XL G2(200,000 x, <9nm Resolution with Optional EDX Elemental Analysis and SE Detector)

• Excellent image quality thanks to the CeB₆ source  with high brilliance at low acceleration voltages
• Ca. 3000 working hours of the source (4-6 years of typical use)
• Magnification up to 200,000x (plus 12x digital zoom)
• Variable acceleration voltage 2 – 20.5 kV
• Opional EDX Detector (25 & 70 mm²)
• Optional SED Detector
• Fast sample preparation
• Easy and fast sample transfer (30-40 seconds)
• Intuitive navigation
• Optional 5-axis stage (XYZTR)
• Robust, space-saving construction; straightforward operation
• As options: 3D reconstruction, surface roughness measurement, stitching and automatic measurement of Asbestos Filter Analysis.

ParticleMetric Software (Particle Measurement)

Phenom Pharos G2 FEG-SEM (2,000,000 x, 2nm Resolution with Optional EDX Elemental Analysis and SE Detector)

• Field Emission Cathode with excellent 2nm resolution
• COMPETITIVE WITH FLOOR-MODELS
• High Vacuum Mode
• Medium Vacuum Mode
• Integrated Charge Reduction (Low Vacuum Mode)
• Standard: 5/10/15/20 kV easy use
• Extended mode: adjustable between 1 kV and 20 kV
• Backscattered Electron Detector (Standard)
• Detector for Energy Dispersive X-Ray Spectroscopy (EDS/EDX) (optional)
• Secondary Electron Detector (Everhart Thornley-optional)
• Sample size up to 25 mm diameter (32 mm optional)
• Sample height up to 35 mm (100 mm optional)

Phenom GSR (Gun Shot Residue, ASTM E1588-17 compatible)

• Sample size max. 100 mm x 100 mm (up to 30 x 12 mm Pin Stubs), max. 40 mm (Height)
• Software specifications:
  • Complies with ASTM E1588-17
  • Typically ≥ 98 % match with standardized Plano-GSR-samples
  • Supports classification of lead-free ammunition types
  • Automatic Calibration for reproducible results
• Detector types
  • Silicon-Drift-Detektor (SDD)
  • Peltier-chilling (LN₂-frei)
• Reporting-Workflow: Particle drift, user-friendly reporting system
• Acquisition-mode: 316 (W) x 587 (L) x 625 (H) mm

Phenom ParticleX (200,000 x, <10nm Resulution, EDX Elemental Analysis and SED as Options)

• Excellent solution for reliable MATERIAL ANALYSIS, e.g. for AUTOMOTIVE INDUSTRY
• Technical purity check on micrometer scale thanks to EDX Analysis
• Acceleration voltages:
  • Standard: 5 kV, 10 kV and 15 kV (expanded mode: adjustable range between 4,8 kV and 20,5 kV)
• Vacuum levels
  • Low
  • Medium
  • High
• Detectors:
  • Backscattered-Electron-Detector (standard)
  • Detector for energydispersive X-Ray spectroscopy (EDS) (standard)
  • Secondary electron detector (Everhart-Thornley-Detector, optional)
• Sample size:
  • max. 100 mm x 100 mm (up to 36 x 12 mm stubs)
  • max. 40 mm (h)
• Exemplary transfer time
  • Light-optical <5 s
  • SEM <60 s

Axia ChemiSEM (1,000,000x Polaroid Resolution, up to 3 nm Resolution, ideal for EDX Analysis)

• Semi-Floor-Model
• Maintenance-friendly (the source can be easily exchanged by the user)
• Motorized, retractable backscattered detector
• TrueSight EDS-Detector
• Nav-Cam Camera – optical color camera for sample navigation
• Manual user interface
• IR-Chamber-Camera
• Maps Software for Tiling and Stitching the images
• Electron beam resolution:
  • 3,0 nm at 30 kV (SE)
  • 3,0 nm at 30 kV (SE) (low vacuum)
  • 8,0 nm at 3 kV (SE)
  • 7,0 nm at 3 kV (BD-Modus* + BSE)
• Chamber:
  • inner width: 280 mm
• Contacts: an Axia ChemiSEM scanning electron microscope with BSED and EDS offers 5 available ports
• Stage:
  • xy: 120 x 120 mm
  • Tilt: -15 bis +90 Grad
  • Rotation: n x 360°
  • With removed ZTR-Axis:
    • Max. Sample height: 128 mm
    • Max. Sample weight: 10 kg
• Typical options
  • Beam Deceleration Mode
  • CleanHeater for Stage (up to 1.100 °C)
  • Cathode Luminescence Detector
  • AutoScript 4 Software – Python-based application programming interface
  • Thermo Scientific TopoMaps Software for image coloring, image analysis and 3D surface reconstruction

Applications

• Pharmaceutical Industry
• powder
• Particle size measurement
• Nanoparticles
• Metallurgical Analysis
• Process control
• Quality control
• Research laboratories
• Fibermetric for the analysis of textile fibers
• Asbestos analysis according to VDI 3492 (with AsbestosScan software)
• Technical purity according to VDA19 / ISO16232
• Additive manufacturing (quality control)
• Table SEM, table electron microscope, tabletop SEM
• EDX, EDS