Modular SPM Electronics and Software

R10: From Bits to Bonds-An Advanced SPM Platform

RHK Technology presents the R10 controller, an advanced scanning probe microscopy (SPM) platform designed for high-performance imaging, spectroscopy, and force-based experiments. It combines time-based data acquisition with a fully digital AFM/STM architecture and large FPGA-based processing to enable flexible multi-probe, multi-frequency operation and complex measurement workflows.

The improved hardware and software architecture enhances performance, signal bandwidth, and data throughput while maintaining long-term compatibility through a modular, upgradeable structure. A platform-independent Inventor SDK with Python, Matlab, or Labview support enables automated workflows and machine learning-driven upgrade paths.

These capabilities enable quantum-scale investigations, including scanning tunneling spectroscopy, single-atom or single-molecule manipulation, as well as spin- or charge-sensitive measurements. Complementary advanced AFM modalities — such as multifrequency AFM, KPFM, MFM, and time-resolved AFM — extend the system’s reach to nanoscale electrical, magnetic, and dynamical characterization. Together, they support the study of quantum materials, qubit systems, and atomic-scale transport and coherence phenomena.

The system is complemented by an intuitive control environment designed to ensure stable, efficient, and reproducible experimental operation across a wide range of applications.

For further information visit: https://www.rhk-tech.com/r10/

Download our free poster: “R10: From Bits to Bonds–An Advanced SPM Platform”