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Scanning Electron Microscopy
Reveal surfaces in stunning detail. Our SEM systems deliver rapid, high-resolution imaging for nanometer-scale analysis across research and industry.
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What is Scanning Electron Microscopy?
Scanning Electron Microscopy (SEM) employs a focused electron beam and specialized detectors to scan sample surfaces, generating high-resolution, high-contrast images of morphology, composition, and topography at nanometer scales—fueling advances in research, quality control, and innovation.
