Schaefer Scientific is pleased to announce the RHK PanScan Freedom II, a next-generation cryogen-free scanning probe microscopy (SPM) system designed for advanced research in quantum materials, nanoscience, and surface science.

The PanScan Freedom II sets a new standard for low-temperature STM and AFM experiments by combining ultra-low temperature operation, high magnetic field capability, and exceptional optical accessibility in a single UHV cryogenic AFM/STM platform. This innovative system enables researchers to achieve helium-level experimental performance without the operational challenges associated with liquid helium cryostats.

Cryogen-Free Low-Temperature SPM Performance

At the core of the PanScan Freedom II is a highly stable cryogen-free low-temperature SPM platform capable of reaching base temperatures down to 5 K. The system integrates a 7 Tesla cryogen-free superconducting magnet, enabling magnetic field dependent experiments without interruptions caused by helium refills.

For laboratories studying quantum materials, correlated electron systems, and nanoscale electronic phenomena, this approach provides the experimental performance of traditional cryogenic systems while significantly simplifying laboratory operation.

Optical Access for Advanced Nanoscale Experiments

A defining feature of the PanScan Freedom II is its unobstructed optical access inside the magnet environment. This unique design allows researchers to combine scanning probe microscopy with optical spectroscopy techniques.

With the optional Lumin high-efficiency optical system, the platform provides:

  • More than 70% light collection efficiency
  • Broadband optical access from Far-IR to Deep-UV
  • Compatibility with Raman spectroscopy, photoluminescence (PL), STM-induced luminescence, and cathodoluminescence

These capabilities make the system an ideal tool for studying light–matter interactions and optically active nanostructures at the nanoscale.

Flexible UHV AFM and STM Measurements

The PanScan Freedom II supports both probe scanning and sample scanning modes, allowing researchers to adapt the system to different experimental requirements. Probe scanning enables ultra-high-resolution STM and AFM measurements, while the optional sample scanning module allows larger scan ranges while maintaining precise probe alignment and optical access.

This versatility makes the system a powerful solution for UHV scanning probe microscopy experiments at cryogenic temperatures.

Applications

The PanScan Freedom II is designed for advanced research areas including:

  • Quantum materials and correlated electron systems
  • Low-temperature STM and AFM experiments
  • UHV surface science
  • Optically active nanostructures
  • Light–matter interaction studies
  • Magnetic field dependent nanoscale spectroscopy

Learn More About UHV Cryogenic AFM/STM Systems

More information about UHV cryogenic AFM and STM scan heads and systems available from Schaefer Scientific can be found here: https://schaefer-scientific.com/product/uhv-cryogenic-afm-stm-scan-heads-and-systems

Researchers interested in discussing experimental requirements or system configurations are welcome to contact the Schaefer Scientific team.